Eclipse L300N Series
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Product Specification
| Brand | JLM |
| Condition | New |
| Warranty | YES |
Product Descriptions
Nikon Eclipse L300N/L300ND FPD / Wafer Inspection microscopes incorporate Nikon’s renowned CFI60 infinity optics, offering the world’s highest level of optical performance. The enhanced epi-fluorescence function, which enables 365nm UV excitation, is optimal for the inspection of semiconductor resist residues on 300mm wafers and organic electroluminescence displays.
for more information please visit :
http://www.nikonmetrology.com/en_EU/Products/Microscope-Systems/Upright-Microscopes/Eclipse-L300N-Series
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