Nikon's premier dynamic focusing system just got better.
Inverted research microscopes -- and their peripheral equipment -- have greatly contributed to the development and advancement of life science research throughout the years. Nikon’s Perfect Focus system has been particularly revolutionary in this area, directly addressing the challenge of focus drift, which reduces the reliability of acquired data, specifically in long-term time-lapse observations using higher magnifications and resolutions. The new Perfect Focus Systems continue to combat this issue by keeping the focus precise and making corrections on a millisecond time-scale thanks to Nikon’s proprietary optical offset method.
KEY FEATURESExclusive Nikon Perfect Focus Technology
For use with Nikon's Eclipse Ti-E Inverted Microscope, the Perfect Focus System (PFS) provides real time focus correction to overcome microscope focus drift caused by thermal and mechanical effects for dramatically increased quality of long-term time-lapse imaging data in live cells.
Focus Detection with Infrared Light
PFS3 uses an LED in the infrared range and an internal linear CMOS detector, to detect the focal point, so it does not intrude on wavelengths used for observation. This means you can carry out observation and focus maintenance at the same time, with no influence at all on captured images.
More Powerful and Versatile than Ever Before
ntroduced in 2005, Nikon's Perfect Focus System set a new standard for live cell imaging. The new third generation system, available in two models, offers a host of enhancements:
Ideal for Most Observation Methods and Applications
Nikon's PFS3 system is ideal for a variety of applications including TIRF. In most commercial applications of TIRF microscopy, a laser beam undergoes total internal reflection at the interface between the specimen and the coverslip, andfluorescence is excited with resulting evanescent wave.
For more information visit : https://www.nikoninstruments.com/Products/Focus-Drift-Correction/Perfect-Focus