Eclipse LV UDM Series
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Product Specification
| Brand | JLM |
| Condition | New |
| Warranty | YES |
Product Descriptions
A motorized microscope with episcopic/diascopic illumination ,which meets the various needs of observation, inspection, research, and analysis across a wide range of industrial fields. Higher NA and a longer working distance than ever before mean superior optical performance and efficient digital imaging.
Max. sample size: 150 x 150 mm
Microscope Type
- Combined reflected/transmitted illumination models
- Motorized type
(Nosepiece / light intensity / aperture stop / observation method selector)
Modularized microscope body applicable with various observations and tasks
Compatible with brightfield, darkfield, simple polarizing, DIC, epifluorescence and two-beam, interferometry observations.
Newly developed CFI60-2 series Newly developed CFI60-2 series provides the ultimate in long working distance levels and the most advanced chromatic aberration in a light weight body
Easy digital imaging
Combining the camera control unit with the LV100DA-U, allows greater information detection and control over a variety of key functions, including the use of objective lenses, light intensity of the illumination unit, aperture stop, observation method adjustment (brightfield/darkfield/fluorescence) and magnification.
for more information please visit :
http://www.nikonmetrology.com/en_EU/Products/Microscope-Systems/Upright-Microscopes/Eclipse-LV100DA-U
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