Gold Testing Machine

1. Goldscope SD Pro:

Cost-effective entry-level X-Ray Fluorescence Measuring Instrument for fast and non-destructive Analysis and Coating Thickness Measurement of Gold and Silver Alloys

The Goldscope SD Pro  is the cost-effective entry-level X-ray fluorescence measuring instrument for non-destructive analysis of jewelry, coins and precious metals.

It is particularly suited for the analysis of precious metals and their alloys in composition and coating thickness. Up to 24 elements can be determined simultaneously.

Typical fields of application are the analysis of:

• Jewelry, precious metals and dental alloys
• Yellow and white gold
• Platinum and silver
• Rhodium
• Alloys and coatings
• Multi layer coatings

Outstanding accuracy and long-term stability are characteristics of all Goldscope systems. The necessity of recalibration is dramatically reduced, saving time and effort.

The modern silicon PIN detector achieves high accuracy and good detection sensitivity.

The fundamental parameter method by FISCHER allows for the analysis of solid and liquid specimens as well as coating systems without calibration.

General Specification

Intended use Energy dispersive X-ray measuring instrument (EDXRF) to analyze precious metals and

their alloys in composition and coating thickness.

Element range Sulfur (16) to Uranium (92) – up to 24 elements simultaneously

Repeatability ≤ 1 ‰ for gold, measurement time 60 sec

Design Bench top unit with upwards opening hood

Measuring direction Bottom up

X-Ray Source

X-ray tube Tungsten tube, thermally stabilized

High voltage Three steps: 30 kV, 40 kV, 50 kV

Aperture (Collimator) O 1 mm (39 mils), optional O 2 mm (79 mils)

Measurement spot O 1.2 mm (47 mils) with aperture O 1 mm (39 mils) and flat lying sample (measurement

distance 0 mm)

X-Ray Detection

X-ray detector Silicon PIN detector with peltier cooling

Resolution (fwhm for Mn-Kα) ≤ 180 eV

Measuring distance 0 … 25 mm (0 … 1 in)

Distance compensation with patented DCM method for simplified measurements at

varying distances. For particular applications or for higher demands on accuracy an

additional calibration might be necessary.

Sample Alignment

Sample positioning Manually

Video microscope High-resolution CCD color camera for optical monitoring of the measurement location

along the primary beam axis,

Crosshairs with a calibrated scale (ruler) and spot-indicator,

Adjustable LED illumination

Zoom factor Digital 1x, 2x, 3x, 4x

Sample Stage

Design Fixed sample support

Usable sample placement area 310 x 320 mm (12.2 x 12.6 in)

Max. sample weight 13 kg (29 lb)

Max. sample height 90 mm (3.5 in)

Electrical data

Power supply AC 115 V or AC 230 V 50 / 60 Hz

Power consumption max. 120 W, without evaluation PC

Protection class IP40

Dimensions

External dimensions Width x depth x height [mm]: 403 x 588 x 365 mm, [in]: 15.9 x 23.1 x 14.4

Weight Approx. 45 kg (99 lb)

Environmental Conditions

Operating temperature 10 °C – 40 °C / 50 °F – 104 °F

Storage/Transport temperature 0 °C – 50 °C / 32 °F – 122 °F

Admissible air humidity ≤ 95 %, non-condensing

Evaluation unit

Computer WindowsR-PC

Software Standard: Fischer WinFTMR BASIC including PDMR,

Optional: Fischer WinFTMR SUPER

Standards

CE approval EN 61010

X-Ray standards DIN ISO 3497 and ASTM B 568

Approval Fully protected instrument with type approval according to the German regulations

„Deutsche Rontgenverordnung-RoV“.

1. Goldscope SDD

X-Ray Fluorescence Measuring Instrument for fast and non-destructive Analysis and Coating Thickness Measurement of Gold

and Silver Alloys

The FISCHERSCOPE X-RAY XAN 220 is an optimized X-ray fluorescence

measuring instrument for non-destructive analysis of jewelry, coins and precious metals.

It is particularly suited for the analysis of precious metals and their alloys in composition and coating thickness. Up to 24 elements in the range of Chlorine (17) to

Uranium (92) can be determined simultaneously.

Typical fields of application are the analysis of:

• Jewelry, precious metals and dental alloys
• Yellow and white gold
• Platinum and silver
• Rhodium
• Alloys and coatings
• Multi layer coatings

Outstanding accuracy and long-term stability are characteristics of all

Goldscope. The necessity of recalibration is dramatically reduced, saving time and effort.

The modern silicon drift detector achieves high accuracy and good detection sensitivity. The fundamental parameter method by Fischer allows for the analysis of solid and liquid specimens as well as coating systems without calibration.

General Specification

Intended use Energy dispersive X-ray measuring instrument (EDXRF) to analyze precious metals

and their alloys in composition and coating thickness.

Element range Chlorine (17) to Uranium U (92) – up to 24 elements simultaneously

Repeatability ≤ 0,5 ‰ for gold, measurement time 60 sec

Design Bench top unit with upwards opening hood

Measurement direction From bottom to top

X-Ray Source

X-ray tube Micro focus tube with tungsten target and beryllium window

High voltage Three steps: 30 kV, 40 kV, 50 kV

Aperture (Collimator) Ø 1 mm (39 mils), optional Ø 2 mm (79 mils)

Measurement spot Aperture diameter plus 200 μm (8 mils), at measurement distance MD = 0 mm

X-Ray Detection

X-ray detector Silicon Drift Detector (SDD), peltier-cooled

Resolution (fwhm for Mn-Kα) ≤ 160 eV

Measuring distance 0 … 10 mm (0 … 0.4 in)

Distance compensation with patented DCM method for simplified measurements at

varying distances. For particular applications an additional calibration might be

necessary.

Sample Alignment

Sample positioning Manually

High-resolution CCD color camera for optical monitoring of the measurement location

along the primary beam axis,

Crosshairs with a calibrated scale (ruler) and spot-indicator,

Adjustable LED illumination of the measurement location

Zoom factor Digital 1x, 2x, 3x, 4x

Sample Stage

Design Fixed sample support

Usable sample placement area 310 x 320 mm (12.2 … 12.6 in)

Max. sample weight 2 kg (4.4 lb)

Max. sample height 90 mm (3.5 in)

Electrical Data

Power supply AC 115 V or AC 230 V 50 / 60 Hz

Power consumption max. 120 W, without evaluation PC

Protection class IP40

Dimensions

External dimensions Width x depth x height [mm]: 403 x 588 x 365 mm, [in]: 15.9 x 23.1 x 14.4

Weight approx. 45 kg (99 lb)

Environmental Conditions

Operating temperature 10 °C – 40 °C (50 °F – 104 °F)

Storage temperature 0 °C – 50 °C (32 °F – 122 °F)

Admissible air humidity ≤ 95 %, non-condensing

Evaluation Unit

Computer Windows®-PC

Software Standard: Fischer WinFTM® BASIC including PDM®

Optional: Fischer WinFTM® SUPER

Standards

CE approval EN 61010

X-Ray standards DIN ISO 3497 and ASTM B 568

Approval Individual acceptance inspection as a fully protected instrument according to the

German regulations „Deutsche Röntgenverordnung-RöV“. Type approval requested

1. Goldscope SDD Pro

High Performance X-Ray Fluorescence Measuring Instrument for fast and non-destructive Analysis of Jewellery, Coins and Precious Metals in Hallmarking Centres, Testing Laboratory and Assaying Centre.

Features

The Goldscope SDD Pro is a high performance, Precise, compact and universally applicable x-ray measuring instrument. It is well suited for the non-destructive coating thickness measurement and material analysis. The  Goldscope SDD Pro is especially well suited for measuring & analyzing thin coatings, even with very complex compositions or small concentrations.

Typical fields of application:

• Jewellery, precious metals and dental alloys
• Yellow and white gold
• Analysis of alloys with highest requirements of accuracy in the jewellery and watch industries, Metal Refineries, Assaying Centres and Hallmarking Centres.
• Platinum, Rhodium and Silver Alloys
• Alloy and Coatings

To create ideal excitation conditions for every measurement, the instrument features electrically changeable apertures and primary filters. The modern silicon drift detector achieves high accuracy and good detection sensitivity.

Outstanding accuracy and long-term stability are characteristics of all

GOLDSCOPE systems. The necessity of recalibration is dramatically reduced, saving time and effort. For high accuracy tasks calibrations can be performed at any time.

The fundamental parameter method by Fischer allows for the analysis of solid and liquid specimens as well as coating systems without calibration.

General Specification

Intended use Energy dispersive X-ray measuring instrument (EDXRF) to determine thin

coatings, trace elements and alloys

Element range Aluminum (13) to Uranium U (92) – up to 24 elements simultaneously

Design Bench top unit with upwards opening hood

Measurement direction From bottom to top

X-Ray Source

X-ray tube Micro focus tube with tungsten target and beryllium window

High voltage Three steps: 10 kV, 30 kV, 50 kV

Aperture (Collimator) 4x changeable: Ø 0.2 mm (7.9 mils), Ø 0.6 mm (23.6 mils), Ø 1 mm (39.4 mils),

Ø 2 mm (78.7 mils), others on request

Primary filter 6x changeable: Ni, free, Al 1000 μm (39.4 mils); Al 500 μm (19.7 mils); Al 100 μm

(3.9 mils); Mylar® 100 μm (3.9mils)

Measurement spot Depending on the measuring distance and on the aperture in use, the actual

measurement spot size is shown in the video image.

Smallest measurement spot: approx. Ø 0.3 mm (11.8 mils)

X-Ray Detection

X-ray detector Silicon Drift Detector (SDD), peltier-cooled

Resolution (fwhm for Mn-Kα) ≤ 160 eV

Measuring distance 0 – 25mm / 0 – 1 in

Distance compensation with patented DCM method for simplified measurements at

varying distances. For particular applications an additional calibration might be

necessary.

Sample Alignment

Sample positioning Manually

High-resolution CCD color camera for optical monitoring of the measurement location

along the primary beam axis,

Crosshairs with a calibrated scale (ruler) and spot-indicator,

Adjustable LED illumination of the measurement location

Zoom factor Digital 1x, 2x, 3x, 4x

Sample Stage

Design Fixed sample support

Usable sample placement area 310 x 320 mm (12.2 … 12.6 in)

Max. sample weight 13 kg (29 lb)

Max. sample height 90 mm (3.5 in)

Electrical Data

Power supply AC 115 V or AC 230 V 50 / 60 Hz

Power consumption max. 120 W, without evaluation PC

Protection class IP40

Dimensions

External dimensions Width x depth x height [mm]: 403 x 588 x 365 mm, [in]: 15.9 x 23.1 x 14.4

Weight approx. 45 kg (99 lb)

Environmental Conditions

Operating temperature 10 °C – 40 °C (50 °F – 104 °F)

Storage temperature 0 °C – 50 °C (32 °F – 122 °F)

Admissible air humidity ≤ 95 %, non-condensing

Evaluation Unit

Computer Windows®-PC

Software Standard: Fischer WinFTM® BASIC including PDM®

Optional: Fischer WinFTM® SUPER

Standards

CE approval EN 61010

X-Ray standards DIN ISO 3497 and ASTM B 568

Approval Individual acceptance inspection as a fully protected instrument according to the

German regulations „Deutsche Röntgenverordnung-RöV“. Type approval requested.

Order

GOLDSCOPE SDD PRO 605-687

incl. Gold Setup, Jewelry Setup and Fashion Jewellery Setup