NeoScope
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Product Specification
| JLM | |
| New | |
| YES |
Product Descriptions
A powerful yet economic benchtop scanning electron microscope from Nikon and JEOL.
As an entirely new advanced imaging tool for bioscience research and industrial inspection fields, the NeoScope benchtop SEM extends your vision by combining the familiarity of a digital camera with the high resolution and depth of field of a powerful SEM.
High performance system in a compact, innovative model
Intuitive touch panel operation with new GUI
- Well focused 3D morphological observation
- Backscattered electron imaging for compositional distribution
- Metrology supported
- Imaging of tilted, rotated samples (Optional)
New capabilities for imaging
- Secondary electron imaging and backscattered electron imaging supported at high vacuum
- Dual frame imaging to facilitate comparison of live and retrieved images
- A wide magnification range from the lowest 10x for wide area of view up to 60,000x
Enhanced low vacuum capability
- Enhanced quality of backscattered electron images
- Easy observation of non conductive samples in the direct low vacuum mode
- Only 2 minutes 30 seconds from sample loading to imaging
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