High-speed automated well plate acquisition, data review and analysis.

Nikon's new High Content Microscope system pairs the Eclipse Ti inverted microscope with NIS-Elements HCSoftware to provide a dedicated interface for high content acquisition and analysis routines, built on an integrated database for seamless data management and processing.

Speed and Flexibility

Nikon's High Content (HC) Analysis System, built on the NIS-Elements platform, streamlines high speed automated well plate acquisition, data review, analysis and management of multiple well plate job runs

Review

Real-time viewing of data acquisition and analysis progress displays for instant inspection.

Multiple analysis assays can be run simultaneously during the imaging phase or run post-acquisition on offline stations.

Analysis

Plate Heat Maps, images, generated binary masks, assay results, sample labeling and other metadata are centralized for quick filtering, gating and drill down to cellular detail.

for more information please visit :

https://www.nikoninstruments.com/Products/High-Content-Imaging-Systems/HCA-High-Content-Microscope-System