HCA High Content Analysis System
Send a free RFQ and get the supplier's best price.
Trade with confidence on Abraa
Safe and secure payments using Abraa safe trade systems
Supplier verification not completed
Pay only through Abraa to stay protected. Never pay a supplier by direct transfer.
Secure Payment
Pay through Abraa, never by direct transfer to a supplier.
Product Inspection
Book a check before shipping to confirm quality and quantity.
Buyer Protection
Get support and refunds if goods arrive not as described.
Verified Suppliers
Licence, address and on-site checks by the Abraa team.
Product Specification
| Brand | JLM |
| Condition | New |
| Warranty | YES |
Product Descriptions
High-speed automated well plate acquisition, data review and analysis.
Nikon's new High Content Microscope system pairs the Eclipse Ti inverted microscope with NIS-Elements HCSoftware to provide a dedicated interface for high content acquisition and analysis routines, built on an integrated database for seamless data management and processing.
Speed and Flexibility
Nikon's High Content (HC) Analysis System, built on the NIS-Elements platform, streamlines high speed automated well plate acquisition, data review, analysis and management of multiple well plate job runs
Review
Real-time viewing of data acquisition and analysis progress displays for instant inspection.
Multiple analysis assays can be run simultaneously during the imaging phase or run post-acquisition on offline stations.
Analysis
Plate Heat Maps, images, generated binary masks, assay results, sample labeling and other metadata are centralized for quick filtering, gating and drill down to cellular detail.
for more information please visit :
https://www.nikoninstruments.com/Products/High-Content-Imaging-Systems/HCA-High-Content-Microscope-System
\